Semiconductor Test Probes

Semiconductor test probes are typically small, double-ended, and fine pitch. Most are used in compression mount device test sockets. A wide variety of platings are available to resist material migration onto the contact surfaces, and increase probe life.

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600354 HELIX® Test-Probe (S500*2440 Series)

S500*2440/400/30@200/S610s/S0a  This probe is the shortest in this family of fine pitch probes...

600794 HELIX® Test-Probe (S500*6600 Series)

S500*6600/1500/30@750/S3800r.Au/S0a.Au  This popular version has a rounded tip. ..